Revisiting Kernel Attention with Correlated Gaussian Process Representation
Tan M Nguyen, Tam Nguyen, Long Bui, Hai Do, Duy Khuong Nguyen, Dung D Le, Hung Tran-The, Nhat Ho, Stan J Osher, Richard G Baraniuk
Tan M Nguyen, Tam Nguyen, Long Bui, Hai Do, Duy Khuong Nguyen, Dung D Le, Hung Tran-The, Nhat Ho, Stan J Osher, Richard G Baraniuk
LM Bui, TT Huu, D Dinh, TM Nguyen, TN Hoang
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA, USA
Talk at London School of Testing, London, UK
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley, CA, USA
Talk at UC San Francisco, Department of Testing, San Francisco, CA, USA